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News
Apr 18, 2013
OSLO 6.6.1 is now available for download, read the lastest article in Photonics Media
Read the latest article about OSLO at http://www.photonics.com/Article.aspx?AID=47301&refer=OpticsNewsletter&utm_source=OpticsNewsletter_2013_04_18&utm_medium=email&utm_campaign=OpticsNewsletter
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Mar 15, 2013
TracePro 7.3.3 is now available for download
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Jan 24, 2013
We are now selling measurement services and metrology hardware, visit our product section
Lambda Research has teamed with several vendors to provide complete surface BSDF measurement services and to sell their metrology products. For normal in-plane BSDF measurement in the visible wavelengths, we team with ScatterMaster LLC of Tucson Arizona which uses their in-house CASI® scatterometer and ScatterScope® 3D scatterometer to take measurements. For IR and UV BSDF measurement, we work with Schmitt Measurement Systems (SMS) in Portland Oregon which uses their IR and UV CASI scatterometers. For complete 4 visible BSDF surface measurements, we team with opsira GmbH in Germany which uses their ’2π and ’4π goniometers.
ScatterMaster and SMS provide in-line measurement at multiple off-axis angles, pricing is generally in the $1,050 to $1,550 range per sample for one azimuth angle and 4 incident angles at a single wavelength. Lambda Research is sent a complete report from either vendor along with the measured data. Lambda Research then fits the measured data using our BSDF converter to create a TracePro ABg surface property model. We then send all information from the vendor and our TracePro surface property to the customer.
The SMS CASI scatterometer offers measurement wavelengths from the UV to the IR. Nondestructive probes measure surface quality, optical performance, smoothness, appearance, defects, and contamination on a wide variety of materials - optical surfaces, diffuse materials, semiconductor wafers, magnetic storage media and precision-machined surfaces. From these accurate and repeatable measurements, Lambda Research engineers create surface and material properties that can be reliably imported into the TracePro surface property databases.
 The gonio’2π and gonio’4π goniometer light and surface source measuring systems record angular dependent photometric parameters around a light source, luminaire, detector or material sample. Both uniaxial in-plane goniometers and 3D-goniometers with up to 4 axes are available depending on the configuration selected. The compact construction of the gonio’2π allows a measurement of the upper half sphere. The 4-axis goniometer enables a fully automated complete measurement of an anisotropic scatter sample. The gonio’4π is available for full sphere measurements without turning the sample. All goniometer types work with an angular accuracy of 0.0001°.
Please contact Lambda Research at techsales@lambdares.com for pricing and information on measurement services.
Lambda Research is proud to be the US representative for opsira’s full line of metrology and testing equipment. We also offer the ScatterScope 3D and CASI scatterometer products as part of our metrology hardware offerings.
Contact techsales@lambdares.com for more information on any of the products, or to request a formal quotation on the unit that best suits your needs.
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