TracePro

Stray Light Analysis

TracePro is used extensively for stray light analysis and related applications, including:

  • Baffle design for stray light suppression 
  • Analysis of stray light due to scattering, aperture diffraction, and ghost images
  • Self-emission of infrared and longer wavelength systems
  • Simulation of polarization effects including birefringence
  • Simulation of spectrometers and other multi-spectral systems
  • Thermal effects and loading
  • Narcissus effects
  • Diffraction gratings

Due to its versatility and generality, TracePro has been used to simulate optical systems operating at wavelengths ranging from the extreme ultraviolet, through the visible and infrared, and out to millimeter wavelengths. The intuitive user interface and CAD interoperability minimize setup time needed for stray light analysis.